Products

Spectroscopic Ellipsometer

SE MF-1000

  1.  Spectroscopic data measurement
    – Visible range: 350~840 nm (or 1.5~3.5 eV)
    – Data acquisition speed: 5 sec for full spectra of {Δ, Ψ}
  2. Compact size for mobility
    – 28 cm (W)× 20 cm (D)× 6 cm (H),  6kg
  3. Easiest operation in the world
    – No set-up / No keys to control
    – No effort for alignment (sample faces down)
    – Maintenance-free (except lamp )
    – Calibration free (patented)*
  4. User-friendly software
    – operation and analysis
  5. Other features
    – Fixed angle of incidence: 70° ± 0.5°
    – Sample size: (8 mm × 8 mm) ~ (200 mm × 200 mm)
    – Computer with current operating software

Most ellipsometers require calibration process in each measurement to find the
azimuths of optical elements.
This is a lengthy and complicated process.
SE MF-1000 is calibration free. This makes fast and easy measurement.

Customized Ellipsometer

Imaging Ellipsometer

  1. ~0.1 nm thickness difference can be seen by IE-1000.
  2. Thickness distribution of thin film can be imaged.
  3. Thickness and optical images of semiconductor device, display, and bio samples.
  4. IE-1000 can show the images which can not be seen by conventional microscope.
  5. Defect of semiconductor and display can be seen directly.
  6. Easy and fast operation.

Spectroscopic Reflectometer

SR MR-1000

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Tel : +82-31-400-3818 / Fax : +82-31-400-3817 / E-mail : ellipsometry@nano-view.com
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